Abstract: An important application of the information technology (IT), which is the creation and improvement of Information Systems for Metrology (ISM) is discussed. These systems initially had a form of Metrological Database (MD) and Metrological Knowledge Bases (MKB). At present, the advanced versions of these systems have a form of the Metrological Expert Systems (MES) using artificial intelligence methods. Two selected examples of Information Systems for Metrology and their practical use are described. An actual state of the ISM ("CAMPV System") designed and developed in the Department of Metrology and Diagnostic Systems, Faculty of Electrical and Computer Engineering at Rzeszow University of Technology, is presented. The system consist of the portal for communication with the system via the Internet and the Metrological Database (MD) collecting the data on the specification of measurement equipment as well as the data obtained in the process of equipment calibration. It has been planned that the system will be expanded by adding the Analytical Metrological Database (AMD) and Metrological Knowledge Base (MKB). A full version of "CAMPV-Expert System" will be dedicated to the computer-aided design of electrical and electronic measurement channels as well as the computer-aided validation of measurement processes, which include such channels.

Keywords: information systems for metrology, metrological databases, metrological knowledge bases, metrological expert systems.

ACM Classification Keywords: A.0 General Literature - Conference proceedings

Link:

INFORMATION SYSTEMS FOR METROLOGY

Roman A. Tabisz, Łukasz Walus

http://foibg.com/ibs_isc/ibs-23/ibs-23-p21.pdf